What ATE Systems Does

ATE Systems has a wide range of skills and capabilities for providing a complete testing solution, from fully autonomous turn-key systems to smaller measurement sub-systems. ATE has unique capabilities in addressing difficult measurement problems involving fixturing, fixture removal, calibration, and error correction. Our holistic approach is focused on improving efficiency and measurement throughput, simplification of the measurement process, and reducing the opportunities for operator error.

Test Fixturing

There are no good measurements without good test fixtures. Ideally the test fixture that makes the electrical connection between the test instrument and the device-under-test (DUT) is electrically transparent. Getting as close to this as possible is the goal.

Fixture removal techniques can correct for some amount of imperfection, but for stable, long-lasting, repeatable measurements, good fixture design is critical.

ATE has developed fixtures for SMT components, leadless packages, and miniature coaxial interfaces, in such a way that the fixture effects can be removed, and the measurement reference plane can be brought right down to the DUT.

Custom Test Systems

ATE Systems has developed a wide variety of custom test systems that integrate commercial test instruments and custom hardware, tied together with a test executive. Features of these systems may include such things as robotic part handing and fully automated calibration for all measurement types.
Examples of the types of tests that have been incorporated include:

  • S-parameters (gain, return loss, VSWR, etc)
  • Noise figure
  • Power
  • Spectral response
  • Linearity
  • Voltage
  • Current
  • Switching speed
  • and so on


InCal VNA Calibration

ATE has developed a revolutionary calibration and error correction methodology that can completely eliminate the need for operator intervention during the calibration process. This technology:

  • Eliminates the need to attach calibration artifacts to the instruments
  • Allows the system to be automatically calibrated at any time without operator intervention
  • Permits calibration with or without the DUT connected
  • Eliminates the need to make ANY hardware changes to switch between calibration and measurement
  • Dramatically reduces the skill level required of the operators
  • Allows the reference plane to be placed at any position along the measurement path
  • Can be used for s-parameter, noise figure, or scalar power measurements



For multi-port measurements, ATE has developed a family of multiplexers for use with 2-port and 4-port VNA’s for interfacing to multi-port DUT’s. These multiplexers cover DC to 50 GHz and have integrated control circuitry for ATE’s InCal modules to simplifiy calibration of an integrated multi-port test system.
MUX Options