Different tradeoffs exist in the capability, performance, and cost of MUX’s or switch matrices. ATE Systems groups these into one of three categories based on its intended application. All of these are available from ATE Systems.
The SIMPLE topology is a good solution if only some of the potential paths through a multiport DUT need to be tested. Since it is the most basic topology, this type of MUX will also have the lowest insertion loss and the smallest price tag.
For testing complex devices over multiple parameters, a MULTI-FUNCTION MUX may be required. This topology provides the maximum flexibility by allowing any of the MUX inputs to be connected to any of the MUX outputs. This may be needed, for example, for a measurements requiring two sources that are only available at specific instrument ports, or a noise figure measurement where the noise receiver is located on a specific instrument port.
The S-PARAMETER topology allows any DUT path to be measured when the MUX is connected to a VNA. This is a good approach if every VNA port has the same capabilities.